Special Issue: Non-Destructive Evaluation via Infrared and Terahertz Imaging Techniques
摘要截稿:
全文截稿: 2018-11-30
影响因子: 2.379
期刊难度:
CCF分类: 无
中科院JCR分区:
• 大类 : 物理与天体物理 - 2区
• 小类 : 仪器仪表 - 3区
• 小类 : 光学 - 2区
• 小类 : 物理:应用 - 3区
Overview
Aims and Scope
Non-Destructive Evaluation (NDE) plays an increasing role in the modern industry. Infrared-based NDE techniques have advantages such as fast, safe, inexpensive etc., if compared to traditional X-ray and ultrasonic techniques. Recently mid- and far-infrared thermography as well as even terahertz (which is beyond far-infrared spectrum) imaging techniques are extremely attractive to scientists and public.
Topics of Interest
This special issue is focused on Non-Destructive Evaluation (NDE) via mid-infrared, far-infrared and especially terahertz spectroscopy. Both laboratory and in-situ applications are welcome, which are within but not limited to the following fields:
- Enhanced experimental methodologies including different excitation ways such as optical, mechanical, laser, inductive etc.
- Numerical modelling integrated with experimental tests