International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-fortest, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
ITC 2020 starts the second half century of the conference. Emerging technologies such as optical, biomedical, and quantum devices will require new test solutions. Artificial Intelligence (AI) and the need for trustworthy devices are providing both new challenges and new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially in automotive applications, are requiring more efficient test, debug, monitoring, and repair techniques that can transfer to the field.
Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. Of particular interest are works dedicated to the topics listed on the right and/or works related to the conference theme and/or works focused on special tracks such as Automotive, AI, or Security. Authors are also invited to submit practical, industry best practices papers. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.
