The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation. In 2019, ETS will take place in the Congress Center in Baden-Baden. It is organized by the Karlsruhe Institute of Technology (KIT), which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA). In addition to scientific paper submissions, this year ETS also offers an embedded workshop track dedicated to work in progress and case studies as well as a PhD forum. The special track on Emerging Test Strategies (ETS2) will again focus on upcoming problems and ideas in an industrial context. A Test Spring School will be organized in conjunction with ETS’19.
You are invited to participate and submit your contributions to ETS’19. The areas of interest include (but are not limited to) the following topics:
Analog, Mixed-signal and RF Test
ATE Hardware and Software
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Current-Based Test
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DFT)
Design for Manufacturing (DFM)
Design Verification and Validation
Diagnosis and Silicon Debug
Economics of Test
Failure Analysis
Fault Modeling and Simulation
Fault Tolerance
Hardware Trojans
Hardware Security
High-Speed I/0 Test
GPU Test
Low-Power IC Test
Memory Test and Repair
MEMS Test
Microprocessor Test
Multi-/Many-core Processor Test
Nanotechnology Test
On-line Test
Power Issues in Test
Design for Reliability
Reliability-Security Trade-offs
Security Issues in Test
Self-Repair
Signal Integrity Testv
Stacked or 3D ICs Test
Standards in Test
System Test
SiP and SoC Test
Test Synthesis
Test, Reliability and Security of Emerging Technologies and Architectures
Test of Reconfigurable Systems
Test Quality
Thermal Issues in Test
Transient and Soft Errors
Variability Issues in Test
Yield Analysis and Enhancement