IEEE international conference on Design & Test of integrated micro & nano-Systems
会议地点: Gammarth, Tunisia
The IEEE international conference on Design & Test of integrated micro & nano-Systems represents a scientific and technological event dedicated to integrated electronic systems which reach the nanoscale era. The interests of the conference cover all the aspects from the design to the test of micro and nano systems.
IEEE DTS is an important meeting where well known researchers from universities and companies will present the latest innovations in the field of micro and nano electronics. It will be also an opportunity for researchers to present and discuss their latest work. IEEE DTS’19 will be organized by the EMC Group of METS laboratory at National Engineering School of Sfax. The conference official language is English.